Facilities

FICS Research SCAN Lab


The FICS Research SeCurity and AssuraNce (SCAN) Lab at the University of Florida contains state-of-the-art, multi-million dollar instruments that provide the capability to perform cutting edge research on a variety of current hardware and software security issues and topics, from device-to-system assurance, security, and integrity analysis.

For any questions about SCAN Lab, please contact Lab Director Domenic Forte (dforte@ece.ufl.edu) or Assistant Lab Director Navid Asadi (nasadi@ece.ufl.edu).

The FICS SCAN Lab is made possible by generous gifts from and collaborations with:

 

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  TektronixR WEB RGB Full Color (28)

 

 

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The following are areas in which the SCAN Lab is currently supporting advancements in research:


FICS
IC Testing and Characterization

FICS
Nanoscale Imaging Capabilities (X-ray, SEM, light microscopy, …)

FICS
Burn-in Test and Reliability Analyses

FICS
Hardware Security and Electrical Test Assessment Capabilities

FICS
Medical Device Test Capability